A high-speed (BW = 150MHz) high-resolution (>12 bit) CT ΔΣ ADC is designed in 28 nm CMOS. Design challenges:
1. DAC mismatch (degraded SFDR); 2. OPAMP insufficient GBW (degraded SNR); 3. Low supply voltage (core VDD = 0.85 V)
1. DAC mismatch (degraded SFDR);
2. OPAMP insufficient GBW (degraded SNR);
3. Low supply voltage (core VDD = 0.85 V)